NDT Devices Blog

GE Inspection Phasor XS

GE Inspection Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.

GE Inspection Phasor XS This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.

GE Inspection Phasor XS

When used in Phased Array mode, the operator can electronically control multiple beams from one probe. The precise beam control including angle, focus and size, results in improved probability of detection (POD) and sizing. With one scan from one contact location, greater area is covered and comprehensive data can be viewed in real time on a full color sector display. When compared to conventional Ultrasonic inspection, the productivity and cost savings from the Phasor XS are easily measured.

GE Inspection Phasor XS 16:64 Phased Array Ultrasonic Flaw Detector

The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.

When used in Phased Array mode, the operator can electronically control multiple beams from one probe. The precise beam control including angle, focus and size, results in improved probability of detection (POD) and sizing. With one scan from one contact location, greater area is covered and comprehensive data can be viewed in real time on a full color sector display. When compared to conventional Ultrasonic inspection, the productivity and cost savings from the Phasor XS are easily measured.

Productivity gains

When the inspection requires a different angle with conventional ultrasonic testing, the operator must change his probe and re-visualize the integration of the new information. A different time base and sensitivity level is represented. Although this is not a problem for the skilled operator, it takes time. Through the power of Phasor XS, these inefficiencies are drastically minimized.

Real time color imaging from the Phasor XS supplies an integrated cross-sectional visualization of the part originating from multiple angles. A single A-Scan can also be selected for display in combination with the image. With a single probe, you can achieve more than ever before – and in less time!

Overall, the Phasor XS provides:

• Improved area coverage, faster results
• More information from one scan of the part
• Better recorded result from the generation of an image
• One probe replicates the capabilities of many conventional UT probes and wedges
• Time and cost savings from reduced hours evaluating indications with multiple angles

Measurable time savings!

Some weld inspections require a complete scan with three separate angles. Using the Phasor XS can result in a time savings of two thirds!

Test quality improvements

Defect orientation is a prediction made in the development of a test procedure and an inspection angle is chosen based on this prediction. Beam spread is chosen purposely broad to account for some level of error in the prediction, so essentially it is a compromise.

With the Phasor XS, electronic control of the beam allows test procedures to be developed that will yield higher Probability of Detection (POD), in the same inspection time, by allowing the choice of an ideal beam over the full inspection area. The quality of the scan is improved and the Phasor XS’ full-color, real time sector display with selectable A-Scan supplies the standard accepted method for instant and reliable sizing.

Simple change over

Building Phased Array capabilities into a successful proven operating platform ensures the transition to Phased Array inspection will be cost effective. Phasor XS’ simple menu driven operation of basic Phased Array controls puts the technology within reach of the Level II field inspector. Data is easily interpreted and the cost of training is minimal.

Standard Features

An on board data set memory is combined with removable storage via an SD card for documentation and setup storage. This ensures your operators will be working with consistent setups to get brilliant results that you can see later on the screen or computer

The unique Sector Freeze mode allows review and storage of all the A-Scans behind the image. Select your beam of interest from all of the shots for separate display and improve your sizing with focal and angle control.

• Combined Phased Array and code compliant Conventional UT flaw detector
• Truly portable Phased Array – less than 4 kg (7 lbs)
• Electronically controlled and selectable beam angles, focus and size
• Simultaneous inspection with multiple beams from a single location
• Full color, real time sector display with a selectable ASCAN
• Fullscreen Bscan plus Display reverse and flip
• Rugged packaging to withstand heavy onsite use
• Snap shot image storage of sector images and ASCANS
• Dialog probes 16/64
• Delay law calculator
• Push button control for operation in a bag
• Simple operating scheme
• Image transfer via SD card

Specifications:

Display Size Resolution	6.5” VGA (640*480 pixel) color TFT, 60Hz refresh rate
Battery Type	Custom Li-Ion battery pack (3S6P configuration)
Battery Life	4 hours minimum
Battery Charging	External charger that connects directly to the battery pack
External Power Supply	Universal input (85 – 265V / 50 – 60 Hz)
Units of Measure	inch and mm
SD Card Memory	Sealed compartment
Number of Cycles Focal Laws	Conventional Channel: 1 Phased Array Channels: 128 (max)
Pulse repetition frequency	Conventional Channel: 15 to 2000Hz Phased Array Channels: 15 to 7680Hz
Pulser Type	Conventional Channel: Spike Phased Array Channels: Bipolar Squarewave
Pulser Voltage	Conventional Channel: 300V (max) Phased Array Channels: /-25V to /-75V
Pulser Energy	Conventional Channel: Low, High Phased Array Channels: n/a
Pulser Rise Time	Conventional Channel: <15ns Phased Array Channels: Not Specified
Damping	Conventional Channel: 50, 500 and 1000 Phased Array Channels: n/a
Dual Mode	Conventional Channel: Off and On Phased Array Channels: n/a
Receiver input Capacitance	Conventional Channel: <50pF Phased Array Channels:
Maximum input voltage	Conventional Channel: 40Vp-p Phased Array Channels:
Bandwidth / Amplifier bandpass	Conventional Channel: 0.3 to 15MHz(-3dB points) Phased Array Channels: 0.5 to 10MHz
Direct Documentation Format	Conventional Channel: JPEG Phased Array Channels: JPEG
Probe Connections	Conventional Channel: 00 Lemo/ BNC Adaptor Supplied Phased Array Channels: Custom Supplied
Physical Probe	Conventional Channel: n/a Phased Array Channels: 1 to 64
Virtual probe	Conventional Channel: n/a Phased Array Channels: 1 to 16
Number of Cycles	Conventional Channel: 1 Phased Array Channels: 1 to 128
Pulser Width (1/2 Cycle)	Conventional Channel: n/a Phased Array Channels: 40 to 500ns
Pulser Delay	Conventional Channel: n/a Phased Array Channels: 0 to 10.24us
Receiver Delay	Conventional Channel: n/a Phased Array Channels: 0 to 10.24us
Receiver Input Resistance	Conventional Channel: 1000ohm (dual mode) Phased Array Channels: 220ohm
Analog Gain	Conventional Channel: 0 to 110.0dB Phased Array Channels: 0 to 40.0dB
Digital Gain	Conventional Channel: n/a Phased Array Channels: 0 to 50.0dB
Frequency Select	Conventional Channel: 2.25MHz, 5MHz, LP and HP Phased Array Channels: 2.25MHz, 5MHz, LP and HP
Rectification	Conventional Channel: PosHW, NegHW and Fullwave Phased Array Channels: PosHW, NegHW and Fullwave
Measurement Resolution	Conventional Channel: 5nsec Phased Array Channels: 5nsec
Displayed Readings	Conventional Channel: A%A, A%B, SA/, SA^, SB/, SB^ Phased Array Channels: A%A, A%B, SA/, SA^, SB/, SB^
VGA output	Conventional Channel: Yes Phased Array Channels: Yes
SD Card Memory	Conventional Channel: Yes Phased Array Channels: Yes
RS 232 interface	Conventional Channel: Yes Phased Array Channels: Yes
Auto Timebase Calibration	Conventional Channel: Yes Phased Array Channels: No
Reject	Conventional Channel: 0 to 80% Phased Array Channels: 0 to 80%
TCG	Conventional Channel: 16 points (max) – 6dB/usec Phased Array Channels: 16 points (max) – 6dB/usec
Sound Velocity	Conventional Channel: .0393 – .5905”/us[1000 – 15000m/s] Phased Array Channels: .0393 – .5905”/us[1000 – 15000m/s]
Range	Conventional Channel: 5m @ steel shear velocity Phased Array Channels: 1m @ steel shear velocity
Weight	Conventional Channel: 7.5lbs (with batteries) Phased Array Channels: 7.5lbs (with batteries)
Size	Conventional Channel: 11.1”W x 6.75”H x 6.25”D (282 x 171 x 159mm) Phased Array Channels: 11.1”W x 6.75”H x 6.25”D (282 x 171 x 159mm)
Display Delay	Conventional Channel: 2.5m @ steel shear velocity Phased Array Channels: 1m @ steel shear velocity
Gates	Conventional Channel: A, B Phased Array Channels: A,B,IF
Gate Threshold	Conventional Channel: 5% to 95% Phased Array Channels: 5% to 95%
Gate Start	Conventional Channel: [0.1mm to 2m] Phased Array Channels: 0.1mm to 1m
Gate Width	Conventional Channel: [0.1mm to 2m] Phased Array Channels: 0.1mm to 1m
Gate Modes	Conventional Channel: Off, Pos, Neg[Off, Coincidence, Anticoincidence] Phased Array Channels:
TOF Modes	Conventional Channel: Flank, Peak Phased Array Channels: Flank, Peak
Scan type	Conventional Channel: n/a Phased Array Channels: Linear or Sector
Data visualization refresh rate	Conventional Channel: 60Hz Phased Array Channels: 60Hz
Available views	Conventional Channel: Ascan Phased Array Channels: Ascan only, Image only, Ascan Image
Dialog Languages	Conventional Channel: English, Spanish, German, French, Chinese, Japanese Phased Array Channels: English, Spanish, German, French, Chinese, Japanese
Environmental tests
Cold Storage	-20C for 72 hrs, 502.4 Procedure I
Cold Operation	0C for 16 hrs, 502.4 Procedure II
Heat Storage	70C for 48 hrs, 501.4 Procedure I
Heat Operation	55C for 16 hrs, 501.4 Procedure II
Damp Heat / Humidity	10 Cycles: 10hrs at 65C down to 30C, 10 hrs at 30C up to 65C, Transition within 2 hrs, 507.4
Temperature Shock	3 Cycles: 4 hrs at –20C up to 70C, 4 hrs at 70C, Transitions within 5 minutes, 503.4 Procedure II
Vibration	514.5-5 Procedure I, Annex C, Figure 6, General exposure: 1hr each axis
Shock	6 cycles each axis, 15g, 11ms half sine, 516.5 Procedure I
Loose Cargo	514.5 Procedure II
Transit Drop	516.5 Procedure IV, 26 drops
IP54 / IEC529 Dust Proof / Dripping water proof as per IEC 529
Environmental sealing tests	IP54 / IEC529 … Dust Proof / dripping water proof as per IEC 529 specifications for IP54 classification Enviromental op temp Low battery indication Amplitude variation expected over battery life Graticule Architectural suppression Linearity on timebase Pulser, Voltage p to p, rise time, duration, fall time, Reverberation ampitude, frequncy spectrum plot Amplifier and attenuator

INCLUDE :

• GE Phasor XS 16:64 Phased Array Ultrasonic Flaw Detector (BC# -L/T*)
• Battery Pack
• AC Adapter/Charger
• User Manual On Cd-ROM
• Carrying Case (G)